24. J. Oh, B. Rammohan, A. Pavgi, S. Tatapudi, G. Tamizhmani, G. Kelly, and M. Bolen, "Reduction of PV module temperature using thermally conductive backsheets," IEEE Journal of Photovoltaics, vol. 8, no. 5, pp. 1160-1167, 2018.
23. K. Shahzad M. Khalid, A. Amin, K. Israr, R. Khan, J. Oh, S. Tatapudi, and G. Tamizhmani, “Addressing potential-induced degradation of field-installed PV modules by reducing surface conductivity,” in SPIE Optical Engineering + Applications, 2018, vol. 10759, pp. 1075906–1075909.
22. J. Oh, A. Pavgi, and G. Tamizhmani, "Determination of empirical coefficients and ΔT for sandia thermal model: dependence on backsheet type," in proceedings of 7th World Conference on Photovoltaic Energy Conversion (WCPEC-7), 2018, pp. 442-446.
21. J. Oh, B. Rammohan, A. Pavgi, S. Tatapudi, G. Tamizhmani, G. Kelly, and M. Bolen, "Reducing photovoltaic module temperature using improved backsheet materials," in proceedings of 7th World Conference on Photovoltaic Energy Conversion (WCPEC-7), 2018, pp. 2826-2831.
20. H. Gopalakrishna, A. Sinha, J. Oh, K. Dolia, S. Tatapudi, and G. Tamizhmani, "Novel accelerated UV testing of field aged modules: correlating EL and UV fluorescence images with current drop," in proceedings of 7th World Conference on Photovoltaic Energy Conversion (WCPEC-7), 2018, pp. 1603-1608.
19. K. Dolia, A. Sinha, S. Tatapudi, J. Oh, and G. Tamizhmani, "Early detection of encapsulant discoloration by UV fluorescence imaging and yellowness index measurements," in proceedings of 7th World Conference on Photovoltaic Energy Conversion (WCPEC-7), 2018, pp. 1267-1272.
18. A. Tummala, J. Oh, S. Tatapudi, and G. Tamizhmani, "Degradation of solder bonds in field aged PV modules: correlation with series resistance increase," in proceedings of 44th IEEE Photovoltaic Specialists Conference (PVSC), 2017, pp. 2912-2917.
17. A. Pavgi, J. Oh, J. Kuitche, S. Tatapudi, and G. Tamizhmani, "Thermal uniformity mapping of PV modules and plants," in proceedings of 44th IEEE Photovoltaic Specialists Conference (PVSC), 2017, pp. 1877-1882.
16. A. Pavgi, J. Kuitche, J. Oh, and G. Tamizhmani, "Climate-specific thermal model coefficients for c-Si and thin-film PV modules," in proceedings of 44th IEEE Photovoltaic Specialists Conference (PVSC), 2017, pp. 1883-1887.
15. C. Castañeda, S. Chattopadhyay, J. Oh, S. Tatapudi, G. Tamizhmani, and H. Hu "Field inspection of PV modules: quantitative determination of performance loss due to cell cracks using EL images," in proceedings of 44th IEEE Photovoltaic Specialists Conference (PVSC), 2017, pp. 1858-1862.
14. B. Bora, J. Oh, S. Tatapudi, O. Sastry, R. Kumar, B. Prasad, and G. Tamizhmani, "Mitigation of PID in commercial PV modules using current interruption method," in proceedings of SPIE Optics + Photonics Conference, San Diego, CA, USA, 2017, pp. 103700D.
13. J. Oh, B. Dauksher, S. Bowden, G. Tamizhmani, P. Hacke, and J. D’Amico, "Further studies on the effect of SiNx refractive index and emitter sheet resistance on potential-induced degradation," IEEE Journal of Photovoltaics, vol. 7, pp. 437-443, 2017.
12. J. Oh, G. Tamizhmani, S. Bowden, and S. Garner, "Surface disruption method with flexible glass to prevent potential-induced degradation of the shunting type in PV modules," IEEE Journal of Photovoltaics, vol. 7, pp. 62-67, 2017.
11. J. Oh, S. Dahal, B. Dauksher, S. Bowden, G. Tamizhmani, and P. Hacke, "A novel technique for performing PID susceptibility screening during the solar cell fabrication process," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2016 IEEE 43rd, Portland, OR, USA, 2016, pp. 907-910.
10. J. Oh, S. Bowden, and G. Tamizhmani, "Potential induced degradation (PID): Incomplete recovery of shunt resistance and quantum efficiency losses," IEEE Journal of Photovoltaics, vol. 5, pp. 1540-1548, 2015.
9. J. Oh, S. Bowden, G. Tamizhmani, and P. Hacke, "Quantum efficiency loss after PID stress: Wavelength dependence on cell surface and cell edge," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2015 IEEE 42nd, New Orleans, LA, USA, 2015, pp. 1-4.
8. J. Oh, G. Tamizhmani, S. Bowden, and S. Garner, "Application of flexible glass to prevent PID in PV modules," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2015 IEEE 42nd, New Orleans, LA, USA, 2015, pp. 1-4.
7. J. Oh, S. Bowden, and G. Tamizhmani, "Application of reverse bias recovery technique to address PID issue: Incompleteness of shunt resistance and quantum efficiency recovery," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2014 IEEE 40th, Denver, CO, USA, 2014, pp. 925-929.
6. J. Oh, G. Tamizhmani, and S. Bowden, "Scaling error of quantum efficiency measurements for heavily shunted cells in reliability research," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2014 IEEE 40th, Denver, CO, USA, 2014, pp. 2635-2638.
5. J. M. Kuitche, V. Sharma, J. Oh, R. Pan, and G. Tamizhmani, "Statistical analysis of commercial c-Si PV module photovoltaic efficiency distribution over 10-years period," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE, Austin, TX, USA, 2012, pp. 2421-2425.
4. J. Oh and G. Tamizhmani, "BAPV modules: Installed-NOCT and temperature coefficients after 1-year exposure," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE, Seattle, WA, USA, 2011, pp. 838-841.
3. J. Kuitche, J. Oh, A. Brunger, T. Inoue, M. Muller, C. Bauerdick, et al., "One year NOCT round-robin testing per IEC 61215 standard," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE, Seattle, WA, USA, 2011, pp. 2380-2385.
2. J. Oh and G. Tamizhmani, "Temperature testing and analysis of PV modules per ANSI/UL 1703 and IEC 61730 standards," in proceedings of the Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE, Honolulu, HI, USA, 2010, pp. 984-988.
1. J. Oh, G. Tamizhmani, and E. Palomino, "Temperatures of building applied photovoltaic (BAPV) modules: air gap effects," in proceedings of the SPIE 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III, San Diego, CA, 2010, pp. 777305.